Petasemi 112GBaud PD Chip Passed Telcordia GR-468 Standard Reliability Test

Petasemi's 112GBaud PD chip has passed Telcordia GR-468 standard reliability tests, including 175℃ HTOL (High Temperature Operating Life) and BDH (Biased Damp Heat) evaluations. The chip maintains stable performance without degradation, meeting the stringent requirements for high-speed optical module applications.

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